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  7. Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits

Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits

Christopher Michael, Mohammed Ismail
167,95 €
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Description

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.

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Parties prenantes

Auteur(s) :
Editeur:

Contenu

Nombre de pages :
190
Langue:
Anglais
Collection :
Tome:
n° 211

Caractéristiques

EAN:
9780792392996
Date de parution :
31-01-93
Format:
Livre relié
Format numérique:
Genaaid
Dimensions :
156 mm x 234 mm
Poids :
476 g

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