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On-Line Testing for VLSI

Livre relié | Anglais | Frontiers in Electronic Testing | n° 11
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Description

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Spécifications

Parties prenantes

Editeur:

Contenu

Nombre de pages :
160
Langue:
Anglais
Collection :
Tome:
n° 11

Caractéristiques

EAN:
9780792381327
Date de parution :
30-04-98
Format:
Livre relié
Format numérique:
Genaaid
Dimensions :
178 mm x 254 mm
Poids :
512 g

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