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In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal suffi...Savoir plus
Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and...Savoir plus
The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Ana...Savoir plus
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and ma...Savoir plus
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behavio...Savoir plus
There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statis...Savoir plus
This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical a...Savoir plus
This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the...Savoir plus
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The ...Savoir plus
This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The resul...Savoir plus
The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect...Savoir plus
This pioneering text explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality...Savoir plus
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a d...Savoir plus
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our think...Savoir plus
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation...Savoir plus
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as ...Savoir plus
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func...Savoir plus
Test and Defect Tolerance for Crossbar-Based Architectures.- Defect-Tolerant Logic with Nanoscale Crossbar Circuits.- Built-in Self-Test and Defect To...Savoir plus
Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing def...Savoir plus
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a ...Savoir plus
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While...Savoir plus
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifyin...Savoir plus
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. T...Savoir plus
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and ...Savoir plus